Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading-edge technologies that include: 3D metrology spanning the chip from nanometer-scale transistors to micron-level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging. Our breadth of offerings across the entire semiconductor value chain help our customers solve their most difficult yield, device performance, quality, and reliability issues.
Onto Innovation is seeking a high-energy individual responsible for advanced metrology product characterization in our Metrology Business Unit. This position shall be based out of our Milpitas, California campus.
A successful candidate shall be responsible for leading product characterization projects through comprehensive programs aimed at extending product performance and capabilities. The job responsibilities in this position include:
Design test plans including samples and conduct experiment to characterize N+1 optical metrology system based on understanding of system and application via close collaboration with R&D, HW/SW engineering, application and marketing
Develop test cases to represent real use cases, generate EARs to add capabilities and/or enhance performance and productivity of metrology solution
Validate & qualify HW/SW performance & use cases of N optical metrology solutions via simulation and experiment
Conduct product demos from planning, preparation, execution and analysis to report.
Develop BKMs/procedures and specifications to qualify N metrology solutions at different PLC phases before beta
Develop training plan and module for the product application engineers/scientists to be ready to support beta N+1 metrology systems
Experience and Requirement:
Post-graduate degree in Physics, Physical Chemistry, Material Science, EE, or Applied Science. Ph.D. is preferred.
Prior experience with working knowledge in one or more of the following areas: semiconductor front-end processes, Thin Film and OCD metrology technologies, optical spectroscopies and material characterization.
Candidate shall have demonstrated key successes in one or more of the following areas:
A highly motivated team player
Critical problem solver with strong analytical skill and familiar to MatLab, Python, MS office
Good interpersonal, presentation and project management skills
Strong motivation to win with a can-do attitude
Candidate must demonstrate flexibility with travel to Onto’s key customers locations globally. Minimum expected travel ~ 25%.